Items where Author is "Bieler, M"

Article

Hampel, B and Liu, B and Nording, F and Ostermann, J and Struszewski, P and Langfahl-Klabes, J and Bieler, M and Bosse, H and Güttler, B and Lemmens, P and Schilling, M and Tutsch, R (2018) Approach to determine measurement uncertainty in complex nanosystems with multiparametric dependencies and multivariate output quantities. Measurement Science and Technology, 29 (3). 035003. ISSN 0957-0233