Patel, Kiran and Kulhare, P. S. and Patel, Arunendra Kumar and Tagore, G. S. and Lakaria, B. L. and Lanjhewar, Aakanksha (2022) Influence of Long-term Application of Fertilizers and Manure on Growth, Yield Attributes and Yield of Wheat. International Journal of Plant & Soil Science, 34 (22). pp. 1540-1545. ISSN 2320-7035
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Abstract
A fertilizer experiment was conducted on wheat (GW 366) during Rabi session 2020-21 and 2021-22 under all India Coordinative Research Project on Long Term Fertilizer Experiment at College of Agriculture, Jawaharlal Nehru Krishi Vishwa Vidyalaya, Jabalpur, to study the effect of long-term application of fertilizers and manure on growth, yield attributes and yield of wheat. Eight treatments comprised of T1 (50% NPK), T2 (100% NPK), T3 (150% NPK), T4 (100% NP), T5 (100% N), T6 (100% NPK + FYM), T7 (100% NPK - S) and T8 (Control) were replicated four times in a randomized block design. The application of 50% NPK, 100% NPK and 150% NPK successively and significantly increased plant height, number of tillers plant-1, number of effective tillers plant-1, number of grains spike-1 and grain yield. While the test weight and straw yield at 150% NPK was found significantly superior to 50% NPK but it was found at par with 100% NPK in both the cases. The application of 100% NPK was found significant over 100% NPK - S for grain yield. The application of 100% NPK + FYM significantly increased the plant height, number of tillers plant-1, number of effective tillers plant-1, number of grains spike-1, test weight, grain and straw yield over 100% NPK, 100% NPK - S, 100% NP and 100% N, but it was found at par with 150% NPK for all the growth and yield attributes. Growth and yield attributes were found significantly and positively correlated with grain and straw yield of wheat.
Item Type: | Article |
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Subjects: | Open Archive Press > Agricultural and Food Science |
Depositing User: | Unnamed user with email support@openarchivepress.com |
Date Deposited: | 23 Feb 2023 09:51 |
Last Modified: | 22 May 2024 09:08 |
URI: | http://library.2pressrelease.co.in/id/eprint/242 |